Silicon AFM Cantilevers

DT-CONTR

Diamond Coated Contact Mode AFM Probe

Coating: Diamond
Tip Shape: Standard

AFM Cantilever:

F

20 kHz

C

0.5 N/m

L

450 µm

HQ:CSC17/Hard/Al BS

Long Scanning, DLC Hardened Contact Mode AFM Probe

Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.18 N/m

L

450 µm

ContDLC

Diamond-Like-Carbon Coated Contact Mode AFM Probe

Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

All-In-One-DLC

Diamond-Like-Carbon Coated AFM Probe with 4 Different AFM Cantilevers for Various Applications

Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

150 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7.4 N/m

40 N/m

L

500 µm

200 µm

150 µm

100 µm

best of the best

AR10T-NCHR

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

AR5T-NCHR

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

the industry standard

NW-AR5T-NCHR

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

TESPA-HAR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

the industry standard

ARROW-UHF

Ultra High Frequency AFM Probe with Tip at the Very End of the Cantilever

Coating: Reflective Aluminum
Tip Shape: Arrow

AFM Cantilever:

F

2000 kHz

C

x

L

35 µm

4XC-NN

AFM Probe with 4 Different AFM Cantilevers with AFM Tips at the Very End of the AFM Cantilevers

Coating: none
Tip Shape: Optimized Positioning

AFM Cantilevers: 4

1

2

3

4

F

17 kHz

75 kHz

150 kHz

1200 kHz

C

0.3 N/m

2.5 N/m

9 N/m

100 N/m

L

500 µm

240 µm

175 µm

65 µm

PPP-CONT

Standard Contact Mode AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

CONT

Standard Contact Mode AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

ESPA

Standard Contact Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

CONTSCR

Contact Mode AFM Probe with Short Cantilever

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

25 kHz

C

0.2 N/m

L

225 µm

Contact-G

Standard Contact Mode AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

HQ:CSC17/No Al

Standard Contact Mode AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.18 N/m

L

450 µm

HQ:CSC37/Al BS

AFM Probe with 3 Different Contact Mode AFM Cantilevers

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

40 kHz

20 kHz

30 kHz

C

0.8 N/m

0.3 N/m

0.4 N/m

L

250 µm

350 µm

300 µm

HQ:CSC38/Al BS

AFM Probe with 3 Different Contact Mode AFM Cantilevers

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

20 kHz

10 kHz

14 kHz

C

0.09 N/m

0.03 N/m

0.05 N/m

L

250 µm

350 µm

300 µm

ARROW-CONT

Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: none
Tip Shape: Arrow

AFM Cantilever:

F

14 kHz

C

0.2 N/m

L

450 µm

CONTSC

Contact Mode AFM Probe with Short Cantilever

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

25 kHz

C

0.2 N/m

L

225 µm