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PeakForce TUNA™ AFM Probes
Conductive AFM and TUNA AFM measurements with PeakForce Tapping®
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30 results
best of the best
CDT-FMR
Diamond Coated, Conductive Force Modulation AFM Probe
Coating:
Diamond,Conductive Diamond
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
105 kHz
C
6.2 N/m
L
225 µm
the industry standard
NW-CDT-FMR
Diamond Coated, Conductive Force Modulation AFM Probe
Coating:
Diamond,Conductive Diamond
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
105 kHz
C
6.2 N/m
L
225 µm
the industry standard
EFM
Electrical, Force Modulation AFM Probe
Coating:
Electrically Conductive
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
top value
HQ:NSC18/Pt
Electrical, Force Modulation AFM Probe
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
top value
240AC-PP
Electrical, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating:
Electrically Conductive
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilever:
F
70 kHz
C
2 N/m
L
240 µm
New
OMCL-AC240TM
Electrical, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating:
Electrically Conductive
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilever:
F
70 kHz
C
2 N/m
L
240 µm
best bang for your buck
ElectriMulti75-G
Electrical, Force Modulation AFM Probe
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
best of the best
PtSi-FM
Electrical, Force Modulation AFM Probes
Coating:
Platinum Silicide Overall
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
HQ:NSC35/Pt
AFM Probe with 3 Different Electrical, Tapping Mode AFM Cantilevers
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
205 kHz
300 kHz
150 kHz
C
8.9 N/m
16 N/m
5.4 N/m
L
110 µm
90 µm
130 µm
best bang for your buck
All-In-One-DD
Diamond Coated, Conductive AFM Probe with 4 Different AFM Cantilevers
Coating:
Conductive Diamond
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
19 kHz
110 kHz
200 kHz
450 kHz
C
0.5 N/m
6.5 N/m
18 N/m
100 N/m
L
500 µm
210 µm
150 µm
100 µm
PtSi-NCH
Electrical, Tapping Mode AFM Probes
Coating:
Platinum Silicide Overall
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
CDT-NCHR
Diamond Coated, Conductive Tapping Mode AFM Probe
Coating:
Diamond,Conductive Diamond
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
400 kHz
C
80 N/m
L
125 µm
NW-CDT-NCHR
Diamond Coated, Conductive Tapping Mode AFM Probe
Coating:
Diamond,Conductive Diamond
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
400 kHz
C
80 N/m
L
125 µm
NCHPt
Electrical, Tapping Mode AFM Probe
Coating:
Electrically Conductive
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
top value
HQ:DMD-XSC11
AFM Probe with 4 Different Diamond Coated, Conductive Cantilevers for Various Applications
Coating:
Conductive Diamond
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
18 kHz
110 kHz
210 kHz
450 kHz
C
0.5 N/m
6.5 N/m
18 N/m
95 N/m
L
500 µm
210 µm
150 µm
100 µm
HQ:NSC36/Pt
AFM Probe with 3 Different Electrical, Force Modulation Mode AFM Cantilevers
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
90 kHz
130 kHz
65 kHz
C
1 N/m
2 N/m
0.6 N/m
L
110 µm
90 µm
130 µm
HQ:DPER-XSC11
AFM Probe with 4 Different Electrical AFM Cantilevers
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15 kHz
80 kHz
155 kHz
350 kHz
C
0.2 N/m
2.7 N/m
7 N/m
42 N/m
L
500 µm
210 µm
150 µm
100 µm
Mix and Match Box
Mixed box: up to 400 MikroMasch AFM probes
Coating:
various
Tip Shape: various
Tip Shape: various
HQ:DPE-XSC11
AFM Probe with 4 Different Electrical Cantilevers
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15 kHz
80 kHz
155 kHz
350 kHz
C
0.2 N/m
2.7 N/m
7 N/m
42 N/m
L
500 µm
210 µm
150 µm
100 µm
HQ:NSC15/Pt
Electrical, Tapping Mode AFM Probe
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
325 kHz
C
40 N/m
L
125 µm