PPP-CONT

The PointProbe^®Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS^™ PPP-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The AFM probe offers unique features:

• excellent AFM tip radius of curvature
• highly doped silicon to dissipate static charge
• chemically inert
• high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.