Optimized positioning through maximized tip visibility
NanoWorld Arrow™ ultra high frequency AFM probes are capable of resonating with a very high frequency (typically around 2.0 MHz). This AFM probe type combines outstanding sensitivity with fast scanning ability.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.
Additionally, this AFM probe offers an excellent tip radius of curvature.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the AFM tip on the area of interest.
If needed, specific cantilever thicknesses can be selected within very narrow tolerances for an additional selection fee.
