Lateral Force Microscopy (LFM) AFM Probes
AFM probes with AFM cantilevers that are highly sensitive to lateral / friction forces for lateral force microscopy measurements
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best of the best
PPP-LFMR
Standard Lateral Force Mode AFM Probes
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
23 kHz
C
0.2 N/m
L
225 µm
PPP-CONTSCR
Contact Mode AFM Probe with Short AFM Cantilever
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
25 kHz
C
0.2 N/m
L
225 µm
HQ:NSC19/Al BS
Standard Force Modulation AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
65 kHz
C
0.5 N/m
L
125 µm
PPP-CONTSC
Contact Mode AFM Probe with Short AFM Cantilever
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
25 kHz
C
0.2 N/m
L
225 µm
HQ:NSC19/No Al
Standard Force Modulation AFM Probe
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
65 kHz
C
0.5 N/m
L
125 µm
Mix and Match Box
Mixed box: up to 400 MikroMasch AFM probes
Coating:
various
Tip Shape: various
Tip Shape: various
best of the best
qp-SCONT
uniqprobe™ - uniform quality SPM probe for soft contact mode
Coating:
Reflective Gold
Tip Shape: Circular symmetric
Tip Shape: Circular symmetric
AFM Cantilever:
F
11 kHz
C
0.01 N/m
L
125 µm
NANOSENSORS™ Special Developments List (SDL)
Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
Coating:
various
Tip Shape: various
Tip Shape: various
