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Silicon AFM Cantilevers
AFM probes with silicon AFM cantilevers
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MagneticMulti75-G
Hard Magnetic, Medium Momentum AFM Probe
Coating:
Magnetic
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
PPP-NCH
Standard Tapping Mode AFM Probe
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
PPP-NCL
Tapping Mode AFM Probe, Long AFM Cantilever
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
NCH
Standard Tapping Mode AFM Probe
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
TESP
Standard Tapping Mode AFM Probe
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
ARROW-NC
Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
Coating:
none
Tip Shape: Arrow
Tip Shape: Arrow
AFM Cantilever:
F
285 kHz
C
42 N/m
L
160 µm
LTESP
Tapping Mode AFM Probe, Long Cantilever
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
NCL
Tapping Mode AFM Probe, Long Cantilever
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
HQ:NSC15/No Al
Standard Tapping Mode AFM Probe
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
325 kHz
C
40 N/m
L
125 µm
HQ:NSC16/No Al
Tapping Mode AFM Probe with Long AFM Cantilever
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
190 kHz
C
45 N/m
L
225 µm
top value
3XC-NA
AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM Tips at the Very End of the AFM Cantilevers
Coating:
Reflective Aluminum
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilevers: 3
1
2
3
F
17 kHz
150 kHz
75 kHz
C
0.3 N/m
9 N/m
2.5 N/m
L
500 µm
175 µm
240 µm
160AC-NN
Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating:
none
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilever:
F
300 kHz
C
26 N/m
L
160 µm
Tap300-G
Standard Tapping Mode AFM Probe
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
300 kHz
C
40 N/m
L
125 µm
Tap190-G
Tapping Mode AFM Probe with Long AFM Cantilever
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
FESP
Standard Force Modulation AFM Probe
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
HQ:NSC36/Al BS
AFM Probe with 3 Different Force Modulation Mode AFM Cantilevers
Coating:
Reflective Aluminum
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
90 kHz
130 kHz
65 kHz
C
1 N/m
2 N/m
0.6 N/m
L
110 µm
90 µm
130 µm
240AC-NN
Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating:
none
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilever:
F
70 kHz
C
2 N/m
L
240 µm
Tap150-G
Soft Tapping Mode AFM Probe
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
150 kHz
C
5 N/m
L
125 µm
PPP-FM
Standard Force Modulation AFM Probe
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
FM
Standard Force Modulation AFM Probe
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm