Rotated AFM Tips

M1-HAR

High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM

Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

320 kHz

C

40 N/m

L

120 µm

ContGB-G

Gold Coated Contact Mode AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

HQ:CSC17/Cr-Au

Gold Coated Contact Mode AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.18 N/m

L

450 µm

HQ:CSC37/Cr-Au

AFM Probe with 3 Different Gold Coated Contact Mode AFM Cantilevers

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

40 kHz

20 kHz

30 kHz

C

0.8 N/m

0.3 N/m

0.4 N/m

L

250 µm

350 µm

300 µm

Tap300GB-G

Gold Coated Tapping Mode AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

300 kHz

C

40 N/m

L

125 µm

Tap190GB-G

Gold Coated Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

HQ:NSC14/Cr-Au

Gold Coated Soft Tapping Mode AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

160 kHz

C

5 N/m

L

125 µm

HQ:NSC15/Cr-Au

Gold Coated Tapping Mode AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

325 kHz

C

40 N/m

L

125 µm

HQ:NSC16/Cr-Au

Gold Coated Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

45 N/m

L

225 µm

HQ:CSC38/Cr-Au

AFM Probe with 3 Different Gold Coated Contact Mode AFM Cantilevers

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

20 kHz

10 kHz

14 kHz

C

0.09 N/m

0.03 N/m

0.05 N/m

L

250 µm

350 µm

300 µm

Tap150GB-G

Gold Coated Soft Tapping Mode AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

150 kHz

C

5 N/m

L

125 µm

Q-WM300

Premounted Standard Tapping Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

300 kHz

C

40 N/m

L

125 µm

Q-CONT

Premounted Standard Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

Q-EFM

Premounted Electrical, Force Modulation AFM Probe, for Quesant/Ambios AFM systems

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-MFM

Premounted Hard Magnetic, Medium Momentum MFM AFM Probe, for Quesant/Ambios AFM systems

Coating: Magnetic
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-Cond-E

Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

Q-WM75

Premounted Standard Force Modulation AFM Probe, for Quesant/Ambios AFM Systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-WM150

Premounted Soft Tapping Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

150 kHz

C

5 N/m

L

125 µm

best bang for your buck

Q-WM190

Premounted Tapping Mode AFM Probe with Long AFM Cantilever, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NANOSENSORS™ Special Developments List (SDL)

Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise

Coating: various
Tip Shape: various