AFM cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when high topographic and phase contrast are necessary. The 15 series is also suitable for non-contact mode.
AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.
This AFM probe features alignment grooves on the back side of the holder chip.
