AFM Probes »

Q-CONT

Order Code / Price*

Quantity

Q-CONT-15 Box of 15 AFM Probes

480 480.00 USD

Product availability: Available on demand. Please contact us for availability!

Side view SEM image of SiNi wedge (double) AFM tip of AFM cantilever l

AFM probe premounted on a T-Plate for Quesant / Ambios AFM systems

Front view SEM image of uncoated AFM tip

Q-CONT

Name: Q-CONT-15 Premounted Standard Contact Mode AFM Probe, for Quesant/Ambios AFM systems
Brand: BudgetSensors
SKU: Q-CONT-15
Price: 480 USD
Availability: InStock

Premounted Standard Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Manufacturer: BudgetSensors

Coating: Reflective Aluminum
AFM tip shape: Rotated

AFM Cantilever

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

Premounted AFM Probes

How to optimize AFM scan parameters

Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation.

The consistent AFM tip radius of less than 10 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

The AFM probe features a reflective aluminum coating on the back side of the AFM cantilever.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on BudgetSensors ContAl-G AFM probe.

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

AFM Tip:

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 10 nm

Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.07 - 0.4 N/m)*

Resonance Frequency: 13 kHz (9 - 17 kHz)*

Length: 450 µm (440 - 460 µm)*

Width: 50 µm (45 - 55 µm)*

Thickness: 2 µm ( 1 - 3 µm)*

* typical range