Uncoated AFM Tips

New

240AC-FG

High Aspect Ratio, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Coating: Reflective Gold
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

70 kHz

C

2 N/m

L

240 µm

EBD-AR15T

High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM

Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

330 kHz

C

40 N/m

L

125 µm

AR10-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

AR5-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

AR5-NCH

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: none
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

NW-AR10-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

NW-AR5-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NW-AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

PNP-TR-Au

Gold Coated Silicon Nitride AFM Probe

Coating: Gold Overall
Tip Shape: Pyramid

AFM Cantilevers: 2

1

2

F

67 kHz

17 kHz

C

0.32 N/m

0.08 N/m

L

100 µm

200 µm

USC-F1.5-k0.6

Ultra-Short Cantilever (USC) mainly dedicated to High-Speed AFM applications in liquid

Coating: Reflective Gold
Tip Shape: Cone Shaped,EBD

AFM Cantilever:

F

1500 kHz

C

0.6 N/m

L

7 µm

M-CIS

EBD AFM whisker for non-contact AFM microlens contact image sensor (CIS) inspection

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

320 kHz

C

40 N/m

L

120 µm

EBD-HAR

Universal high-aspect ratio EBD AFM whisker for enhanced resolution, imaging stability and AFM tip lifetime

Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

330 kHz

C

40 N/m

L

125 µm

EBD-AR20T

High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM

Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

330 kHz

C

40 N/m

L

125 µm

M1-HAR

High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM

Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

320 kHz

C

40 N/m

L

120 µm

ATEC-CONTAu

Gold Coated Contact Mode AFM Probe with REAL Tip Visibility

Coating: Gold Overall
Tip Shape: Visible

AFM Cantilever:

F

15 kHz

C

0.2 N/m

L

450 µm

SuperSharpStandard-FM

SuperSharp diamond-like EBD AFM whisker for soft tapping AFM

Coating: Reflective Aluminum
Tip Shape: Cone Shaped,Supersharp,EBD

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

PPP-ZEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

27 N/m

L

225 µm

ZEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

27 N/m

L

225 µm

PPP-SEIH

Special Tapping Mode AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm