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240AC-FG-5 Box of 5 AFM Probes
1100.00 USD
Product availability: On stock
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240AC-FG

New

High Aspect Ratio, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Reflective Gold
AFM tip shape: High-Aspect-Ratio
AFM Cantilever
F 70 kHz
C 2 N/m
L 240 µm
*nominal values
Applications
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The 240AC-FG with a carbon nanofiber at the end of the silicon tip is designed for soft AC mode AFM imaging of deep trenches. The typical fiber radius of curvature is 10 nm and the diameter is 50 nm at a height of 200 nm away from the apex.

The gold coating ensures high and stable laser reflectivity in air and liquids. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

Please note that while the tetrahedral tip and the tip side of the cantilever are gold coated, the diamond-like spike remains uncoated.

This AFM probe features alignment grooves on the back side of the holder chip.

70 nm Au on both sides of the cantilever. The coating does not cover the high aspect ratio spike!
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm ( 2.1 - 3.1 µm)*
  • * typical range
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