NanoAndMore USA does not ship to your country


Expertise and creativity!Thu Jan 19 2023
Within every piece of silicon crystal lies hidden an AFM probe. We have the right tools, expertise and creativity to carve it.
#AFMProbes #AtomicForceMicroscopy


OPUS 3XC-GG AFM probes used in a recent studyMon Jan 16 2023


MikroMasch® wishes you a Merry Christmas and a Happy New Year!Thu Dec 22 2022
#AFMprobes #AFM #AtomicForceMicroscopy #merrychristmas #happynewyear2023


Happy Holiday Season from BudgetSensors®!Thu Dec 22 2022
Happy Holiday Season from BudgetSensors®!


Season’s Greetings from NANOSENSORS™ AFM probesThu Dec 22 2022


50 years ago, wow!Wed Dec 14 2022


Understanding the Nano-Indentation Deformation Behavior of PolycarbonateWed Dec 14 2022
- Title: Molecular deformation mechanism of polycarbonate during nano-indentation: Molecular dynamics simulation and experimentation
- Authors: Daiki Ikeshima, Kazunori Miyamoto, Akio Yonezu
- Publication: Polymer
- Publisher: Elsevier
- Date: 31 May 2019
https://www.nanotools.com/blog/understanding-nano-indentation-deformation-behavior-of-polycarbonate.html
#AFM #metrology #topography #microscopy #nanotechnology #AFMProbes #spm #SPMProbes


Chemically characterizing the cortical cell nano-structure of human hair using atomic force microscopy integrated with infrared spectroscopy (AFM-IR)Thu Dec 08 2022


Happy birthday Prof. Quate!Wed Dec 07 2022


Thank you all for visiting our NanoAndMore USA booth at this year’s Materials Research Society - MRSFri Dec 02 2022


BudgetSensors® Tap300Al-G AFM probes used in a studyFri Dec 02 2022


NanoAndMore USA booth no. 311 is all set up and we're exited to welcome youMon Nov 28 2022
Materials Research Society - MRS MRS Fall 2022 Conference and Exhibit.
https://youtu.be/jvVANnajnFg


Happy ThanksgivingThu Nov 24 2022


Photoinduced Charge Transfer and Trapping on Single Gold Metal Nanoparticles on TiO2Tue Nov 22 2022


HQ:CSC38/Al BS and HQ:CSC38/Cr-Au ultrasoft silicon AFM cantileversMon Nov 14 2022


World Science Day for Peace and DevelopmentThu Nov 10 2022


Capturing and Analyzing 2D-Materials’ SEM and AFM Images on the Same Sample LocationTue Nov 08 2022
- Title: Advanced Hybrid Positioning System of SEM and AFM for 2D Material Surface Metrology
- Authors: Jaeryong Kim, Donghwan Kim, TaeWan Kim, Hyunwoo Kim, ChaeHo Shin
- Publication: Microscopy and Microanalysis
- Publisher: Cambridge University Press
- Date: June 9, 2022
https://www.nanotools.com/blog/capturing-and-analyzing-2d-materials-sem-and-afm-images-on-the-same-sample-location.html
#AFM #metrology #topography #microscopy #nanotechnology #AFMProbes #spm #SPMProbes


Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopyMon Nov 07 2022


OPUS 160AC-NA AFM Probe used in a recent studyThu Nov 03 2022


BudgetSensors® ContGB-G AFM Probes used in a recent studyMon Oct 31 2022
