AFM cantilevers of the 19 series combine the high frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*. These AFM cantilevers are also used for Lateral force microscopy LFM due to their high sensitivity to the lateral forces.
This AFM probe features alignment grooves on the back side of the holder chip.
Scanned with a MikroMasch HQ:NSC19/Al BS AFM probe, 1200 nanometer scan size
Image courtesy of Dr. Penka Terziyska, Innovative Solutions Bulgaria
Gallium antimonide (GaSb) quantum dots on gallium arsenide GaAs buffer layer obtained by liquid phase epitaxy. The height of the quantum dots is ~1nm.
Scanned with a MikroMasch HQ:NSC19/Al BS AFM probe in light tapping mode, 5 micron scan size
Image courtesy of Dr. Penka Terziyska, Innovative Solutions Bulgaria
Crack in a carbon layer deposited on a glass substrate
Scanned with a MikroMasch HQ:NSC19/Al BS AFM probe, 8 micron scan size, 250 nanometer z-height
Image courtesy of Dr. Penka Terziyska, Innovative Solutions Bulgaria
Central region of a self-organized Archimedean spiral pattern in a colloidal carbon film on glass. Sample provided by Dr. K. Shtarbova.
Scanned with a MikroMasch HQ:NSC19/Al BS AFM probe, 40 micron scan size
Image courtesy of Dr. Penka Terziyska, Innovative Solutions Bulgaria
