NANOSENSORS™ CDT-CONTR AFM probes are designed for contact mode (repulsive mode) SPM imaging.
For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
The AFM probe offers unique features:
This AFM probe features alignment grooves on the back side of the holder chip.
