AFM Support Chips with Alignment Grooves

the industry standard

NW-AR5T-NCHR

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

TESPA-HAR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

USC-F2-k3

Ultra-Short Cantilever (USC) mainly dedicated to dynamic High-Speed AFM applications in air

Coating: Reflective Gold
Tip Shape: Cone Shaped,EBD

AFM Cantilever:

F

2000 kHz

C

3 N/m

L

10 µm

USC-F1.2-k7.3

Ultra-Short Cantilever (USC) mainly dedicated to dynamic High-Speed AFM applications in air

Coating: Reflective Gold
Tip Shape: Cone Shaped,EBD

AFM Cantilever:

F

1200 kHz

C

7.3 N/m

L

20 µm

PPP-CONT

Standard Contact Mode AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

qp-CONT

uniqprobe™ - uniform quality SPM probe for contact mode

Coating: Reflective Gold
Tip Shape: Circular symmetric

AFM Cantilever:

F

30 kHz

C

0.1 N/m

L

125 µm

best of the best

qp-SCONT

uniqprobe™ - uniform quality SPM probe for soft contact mode

Coating: Reflective Gold
Tip Shape: Circular symmetric

AFM Cantilever:

F

11 kHz

C

0.01 N/m

L

125 µm

CONT

Standard Contact Mode AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

ESPA

Standard Contact Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

CONTSCR

Contact Mode AFM Probe with Short Cantilever

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

25 kHz

C

0.2 N/m

L

225 µm

HQ:CSC17/No Al

Standard Contact Mode AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.18 N/m

L

450 µm

CONTSC

Contact Mode AFM Probe with Short Cantilever

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

25 kHz

C

0.2 N/m

L

225 µm

PPP-CONTAuD

Gold Coated Contact Mode AFM Probe

Coating: Reflective Gold
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

PPP-CONTSCAuD

Gold Coated Contact Mode AFM Probe with Short AFM Cantilever

Coating: Reflective Gold
Tip Shape: Standard

AFM Cantilever:

F

25 kHz

C

0.2 N/m

L

225 µm

HQ:CSC17/Cr-Au BS

Gold Coated Contact Mode AFM Probe

Coating: Reflective Gold
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.18 N/m

L

450 µm

PPP-BSI

Soft Contact AFM Probe for Biological Applications

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

28 kHz

C

0.1 N/m

L

225 µm

top value

160AC-FG

High Aspect Ratio, Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Coating: Reflective Gold
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

300 kHz

C

26 N/m

L

160 µm

New

240AC-FG

High Aspect Ratio, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Coating: Reflective Gold
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

70 kHz

C

2 N/m

L

240 µm

AR10-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

AR5-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm