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CONTSCR

Order Code / Price*

Quantity

CONTSCR-10 Box of 10 AFM Probes

335 335.00 USD

Volume Discount Available [?]

CONTSCR-20 Box of 20 AFM Probes

600 600.00 USD

Your volume discount is 70.00 USD or 10.40%

CONTSCR-50 Box of 50 AFM Probes

1324 1324.00 USD

Your volume discount is 351.00 USD or 21.00%

CONTSCR-W Box of 380 AFM Probes

7050 7050.00 USD

Your volume discount is 5680.00 USD or 44.60%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

SEM image of PointProbe® Plus AFM tip

CONTSCR

Name: CONTSCR-10 Contact Mode AFM Probe with Short Cantilever
Brand: NanoWorld
SKU: CONTSCR-10
Price: 335 USD
Availability: InStock

Contact Mode AFM Probe with Short Cantilever

Manufacturer: NanoWorld

Coating: Reflective Aluminum
AFM tip shape: Standard

AFM Cantilever

F 25 kHz

C 0.2 N/m

L 225 µm

*nominal values

Applications

Contact Mode AFM Probes

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

NanoWorld Pointprobe® CONTSCR AFM probe is an alternative AFM cantilever type for contact mode applications. The length of the AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

All SPM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 8 nm (< 12 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.02 - 0.7 N/m)*

Resonance Frequency: 25 kHz (10 - 39 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 48 µm (42.5 - 52.5 µm)*

Thickness: 1 µm ( 0.5 - 1.5 µm)*

* typical range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.