AFM Support Chips with Alignment Grooves

AFM probes with support chips wtih alignment grooves
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288 results
AR5-NCH
AR5-NCH
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: none
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
NW-AR10-NCHR
NW-AR10-NCHR
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
NW-AR5-NCHR
NW-AR5-NCHR
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
AR5-NCLR
AR5-NCLR
High-Aspect-Ratio, Tapping Mode AFM Probe with Long AFM Cantilever
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
NW-AR5-NCLR
NW-AR5-NCLR
High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
CDT-NCHR
CDT-NCHR
Diamond Coated, Conductive Tapping Mode AFM Probe
Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F
400 kHz
C
80 N/m
L
125 µm
CDT-NCLR
CDT-NCLR
Diamond Coated, Conductive Tapping Mode AFM Probe with Long AFM Cantilever
Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F
210 kHz
C
72 N/m
L
225 µm
NW-CDT-NCHR
NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F
400 kHz
C
80 N/m
L
125 µm
NW-CDT-NCLR
NW-CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F
210 kHz
C
72 N/m
L
225 µm
PPP-NCHPt
PPP-NCHPt
Electrical, Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
PPP-NCSTPt
PPP-NCSTPt
Electrical, Soft Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F
160 kHz
C
7.4 N/m
L
150 µm
PPP-NCLPt
PPP-NCLPt
Electrical, Tapping Mode AFM Probe with a Long AFM Cantilever
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
NCHPt
NCHPt
Electrical, Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
HQ:NSC15/Pt
HQ:NSC15/Pt
Electrical, Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
325 kHz
C
40 N/m
L
125 µm
NCLPt
NCLPt
Electrical, Tapping Mode AFM Probe with a Long Cantilever
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
HQ:NSC16/Pt
HQ:NSC16/Pt
Electrical, Tapping Mode AFM Probe with Long AFM Cantilever
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
190 kHz
C
45 N/m
L
225 µm
HQ:NSC14/Pt
HQ:NSC14/Pt
Electrical, Soft Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
160 kHz
C
5 N/m
L
125 µm
ElectriTap190-G
ElectriTap190-G
Electrical, Tapping Mode AFM Probe with Long AFM Cantilever
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
ElectriTap150-G
ElectriTap150-G
Electrical, Soft Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
150 kHz
C
5 N/m
L
125 µm
PPP-CONTPt
PPP-CONTPt
Electrical, Contact Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F
13 kHz
C
0.2 N/m
L
450 µm
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