TESPA-HAR

NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping^™ mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored AFM tips showing a high aspect ratio portion with near-vertical sidewalls.

These AFM probes offer unique features:

• length of the high aspect ratio portion of the tip > 2 µm
• typical aspect ratio of this portion in the order of 7:1 (when viewed from side as well as along cantilever axis)
• half cone angle of the high aspect ratio portion typically < 5°
• excellent tip radius of curvature

This AFM probe features alignment grooves on the back side of the holder chip.