Silicon AFM Support Chips

ATEC-NCPt

Electrical, Tapping Mode AFM Probe with REAL Tip Visibility

Coating: Electrically Conductive
Tip Shape: Visible

AFM Cantilever:

F

335 kHz

C

45 N/m

L

160 µm

PPP-NCSTPt

Electrical, Soft Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

160 kHz

C

7.4 N/m

L

150 µm

PPP-NCLPt

Electrical, Tapping Mode AFM Probe with a Long AFM Cantilever

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NCHPt

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

ARROW-NCPt

Electrical, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: Electrically Conductive
Tip Shape: Arrow

AFM Cantilever:

F

285 kHz

C

42 N/m

L

160 µm

top value

HQ:DMD-XSC11

AFM Probe with 4 Different Diamond Coated, Conductive Cantilevers for Various Applications

Coating: Conductive Diamond
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

18 kHz

110 kHz

210 kHz

450 kHz

C

0.5 N/m

6.5 N/m

18 N/m

95 N/m

L

500 µm

210 µm

150 µm

100 µm

HQ:NSC36/Pt

AFM Probe with 3 Different Electrical, Force Modulation Mode AFM Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

90 kHz

130 kHz

65 kHz

C

1 N/m

2 N/m

0.6 N/m

L

110 µm

90 µm

130 µm

HQ:DPER-XSC11

AFM Probe with 4 Different Electrical AFM Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

HQ:DPE-XSC11

AFM Probe with 4 Different Electrical Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

HQ:NSC15/Pt

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

325 kHz

C

40 N/m

L

125 µm

ElectriAll-In-One

Electrical AFM Probe with 4 Different AFM Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

150 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7.4 N/m

40 N/m

L

500 µm

210 µm

150 µm

100 µm

NCLPt

Electrical, Tapping Mode AFM Probe with a Long Cantilever

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

HQ:NSC16/Pt

Electrical, Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

45 N/m

L

225 µm

HQ:NSC14/Pt

Electrical, Soft Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

160 kHz

C

5 N/m

L

125 µm

HQ:XSC11/Pt

AFM Probe with 4 Different Electrical Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

ElectriTap300-G

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

300 kHz

C

40 N/m

L

125 µm

ElectriTap190-G

Electrical, Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

ElectriTap150-G

Electrical, Soft Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

150 kHz

C

5 N/m

L

125 µm

PPP-CONTPt

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

PPP-CONTSCPt

Electrical, Contact Mode AFM Probe with Short AFM Cantilever

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

25 kHz

C

0.2 N/m

L

225 µm