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HQ:XSC11/Pt-15 Box of 15 AFM Probes
450.00 EUR
HQ:XSC11/Pt-50 Box of 50 AFM Probes
1300.00 EUR
Your volume discount is 200.00 EUR or 13.30%
HQ:XSC11/Pt-100 Box of 100 AFM Probes
2400.00 EUR
Your volume discount is 600.00 EUR or 20.00%
Product availability: On stock
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HQ:XSC11/Pt

AFM Probe with 4 Different Electrical Cantilevers

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
*nominal values
Applications
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AFM probes of the 11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.

AFM probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm.

The 30 nm conductive Pt coating is continuous from the tip end to the bulk of the silicon chip. The coating covers both the tip and the back side of the AFM cantilever.
AFM Tip:

  • 4 AFM Cantilevers:
    Cantilever A
  • Beam
  • 0.2 N/m (0.1 - 0.4 N/m)*
  • 15 kHz (12 - 18 kHz)*
  • 500 µm (495 - 505 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • Cantilever B
  • Beam
  • 2.7 N/m (1.1 - 5.6 N/m)*
  • 80 kHz (60 - 100 kHz)*
  • 210 µm (205 - 215 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • Cantilever C
  • Beam
  • 7 N/m (3 - 16 N/m)*
  • 155 kHz (115 - 200 kHz)*
  • 150 µm (145 - 155 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • Cantilever D
  • Beam
  • 42 N/m (17 - 90 N/m)*
  • 350 kHz (250 - 465 kHz)*
  • 100 µm (95 - 105 µm)*
  • 50 µm (47 - 53 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • * typical range
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