AFM Support Chip, Side View
AFM support chips made of single crystal silicon
AFM support chips made of borosilicate glass (BSG)
Silicon Nitride AFM Probe Single Cantilever Compatible with ScanAsyst®** Mode
AFM Support Chip with Alignment Grooves (Backside View)
The XY-auto-alignment probes extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to probes with different cantilever lengths. Probe exchange with a tip repositioning accuracy of better than ± 8 µm is possible for all probes of the XY-alignment probes series - independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225 µm.
Overview of all different types of AFM tips classified by shape, material and coating. Discover the available AFM tips ranging from SuperSharpSilicon AFM tips for atomic resolution AFM imaging to the robust diamond coated AFM tips with extreme durability!
Overview of the different types of AFM cantilevers classified by shape, material and coating. NanoAndMore offer everything from thin triangular silicon nitride AFM cantilevers to short megahertz silicon AFM cantilevers for high speed scanning AFM.
Some special AFM probes that do not fit into the standard classification pattern such as tipless AFM cantilevers, ultra AFM cantilevers, self sensing / self actuating AFM probes, etc.
Some special AFM probes that do not fit into the standard classification pattern such as tipless AFM cantilevers, ultra AFM cantilevers, self sensing / self actuating AFM probes, etc.
