AFM Probes »

PPP-CONTSCPt

Order Code / Price*

Quantity

PPP-CONTSCPt-10 Box of 10 AFM Probes

461 461.00 EUR

Volume Discount Available [?]

PPP-CONTSCPt-20 Box of 20 AFM Probes

823 823.00 EUR

Your volume discount is 99.00 EUR or 10.70%

PPP-CONTSCPt-50 Box of 50 AFM Probes

1814 1814.00 EUR

Your volume discount is 491.00 EUR or 21.30%

Product availability: On stock

Front view SEM image of PointProbe® Plus AFM tip

Close-up view SEM image of PointProbe® Plus AFM tip

PPP-CONTSCPt

Name: PPP-CONTSCPt-10 Electrical, Contact Mode AFM Probe with Short AFM Cantilever
Brand: NANOSENSORS
SKU: PPP-CONTSCPt-10
Price: 461 EUR
Availability: InStock

Electrical, Contact Mode AFM Probe with Short AFM Cantilever

Manufacturer: NANOSENSORS

Coating: Electrically Conductive
AFM tip shape: Standard

AFM Cantilever

F 25 kHz

C 0.2 N/m

L 225 µm

*nominal values

Applications

Conductive AFM Probes

How to optimize AFM scan parameters

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

The NANOSENSORS™ PPP-CONTSCPt is an alternative AFM cantilever type for contact mode applications. The length of AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

The AFM probe offers unique features:

metallic conductivity of the AFM tip
high mechanical Q-factor for high sensitivity
precise alignment of the AFM cantilever position (within +/-2µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This AFM probe features alignment grooves on the back side of the holder chip.

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.01 - 1.87 N/m)*

Resonance Frequency: 25 kHz (1 - 57 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 48 µm (40 - 55 µm)*

Thickness: 1 µm ( 0.1 - 2 µm)*

* guaranteed range