AFM Probes »

HQ:DPE-XSC11

Order Code / Price*

Quantity

HQ:DPE-XSC11-15 Box of 15 AFM Probes

490 490.00 EUR

Volume Discount Available [?]

HQ:DPE-XSC11-50 Box of 50 AFM Probes

1400 1400.00 EUR

Your volume discount is 233.33 EUR or 14.30%

HQ:DPE-XSC11-100 Box of 100 AFM Probes

2500 2500.00 EUR

Your volume discount is 766.67 EUR or 23.50%

Product availability: On stock

AFM cantilevers of 4 different applications AFM probe by MikroMasch

AFM tip of MikroMasch AFM probe with 4 different applications AFM cantilevers

AFM probe with 4 different applications AFM cantilevers by MikroMasch

SEM image of DPE series AFM probe tip close-up

Schematic of four-lever XSC series MikroMasch AFM Probe

HQ:DPE-XSC11

Name: HQ:DPE-XSC11-15 AFM Probe with 4 Different Electrical Cantilevers
Brand: MikroMasch
SKU: HQ:DPE-XSC11-15
Price: 490 EUR
Availability: InStock

AFM Probe with 4 Different Electrical Cantilevers

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated

This probe features 4 cantilevers

F 15 kHz

C 0.2 N/m

L 500 µm

F 80 kHz

C 2.7 N/m

L 210 µm

F 155 kHz

C 7 N/m

L 150 µm

F 350 kHz

C 42 N/m

L 100 µm

*nominal values

Applications

How to optimize AFM scan parameters

AFM probes of the 11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used for various electrical measurements.

The DPE AFM probes have a special structure of conductive layers applied to the AFM tip that provides better signal to noise ratio on the scans of electric properties. The coating thickness is increased, which gives more freedom for using them in contact electrical modes. The AFM probes provide better performance and higher contrast of electrical signals, while the ability to resolve the small surface details might be reduced. The AFM probes can be used in dynamic electrical modes when a study of the electric properties of a sample has higher priority.

The conductive Pt coating covers the entire silicon chip, AFM cantilevers and AFM tips. It provides high conductivity and enhances the laser reflectivity.

AFM Tip:

Shape: Rotated

Height: 15 µm (12 - 18 µm)*

Full Cone Angle: 40°

Radius: < 40 nm

4 AFM Cantilevers:

Cantilever A

Shape: Beam

Force Constant: 0.2 N/m (0.1 - 0.4 N/m)*

Resonance Frequency: 15 kHz (12 - 18 kHz)*

Length: 500 µm (495 - 505 µm)*

Width: 30 µm (27 - 33 µm)*

Thickness: 2.7 µm ( 2.2 - 3.2 µm)*

Cantilever B

Shape: Beam

Force Constant: 2.7 N/m (1.1 - 5.6 N/m)*

Resonance Frequency: 80 kHz (60 - 100 kHz)*

Length: 210 µm (205 - 215 µm)*

Width: 30 µm (27 - 33 µm)*

Thickness: 2.7 µm ( 2.2 - 3.2 µm)*

Cantilever C

Shape: Beam

Force Constant: 7 N/m (3 - 16 N/m)*

Resonance Frequency: 155 kHz (115 - 200 kHz)*

Length: 150 µm (145 - 155 µm)*

Width: 30 µm (27 - 33 µm)*

Thickness: 2.7 µm ( 2.2 - 3.2 µm)*

Cantilever D

Shape: Beam

Force Constant: 42 N/m (17 - 90 N/m)*

Resonance Frequency: 350 kHz (250 - 465 kHz)*

Length: 100 µm (95 - 105 µm)*

Width: 50 µm (47 - 53 µm)*

Thickness: 2.7 µm ( 2.2 - 3.2 µm)*

* typical range