Buy these AFM Probes together with other BudgetSensors AFM probes of your choice in a Budget Combo Box!
Micromachined monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as:
The consistent AFM tip radius of less than 25 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.
The AFM probe features an overall chromium-platinum coating.
With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.
Consistent high quality at a lower price!
This AFM probe features alignment grooves on the back side of the holder chip.
Anode oxidation of a Si substrate performed with a BudgetSensors ElectriTap300-G AFM probe on a JEOL JSPM-5200 AFM system
Scanned with a BudgetSensors ElectriTap300-G AFM probe, 4 micron scan size
Image courtesy of Takashi Sueyoshi JEOL Ltd, Japan
Scanned with a BudgetSensors ElectriTap300-G AFM probe, 8 micron scan size
Image courtesy of Steve Liu, Dual Signal Tech Corp.
Kelvin Probe Measurement on graphene exfoliated on strontium titanate (SrTiO3) obtained in non-contact AFM mode using a frequency shift of -5 Hz. The graphene was irradiated with xenon 23+ ions under grazing incidence of 6°. On monolayer the impact of the ions lead to characteristic folding. In Bias-Image the exposed underlying substrate in this area can be clearly seen. Also, the monolayer shows lower surface potential difference to SrTiO3 than few monolayers.
Scanned with a BudgetSensors ElectriTap300-G AFM probe on a RHK Technology SPM 1000 Control System
Image courtesy of Benedict Kleine Bussmann, Oliver Ochedowski, Marika Schleberger AG Schleberger, University Duisburg-Essen
