ATEC-CONTPt

NANOSENSORS™ AdvancedTEC™ ContPt AFM probes are designed for contact mode imaging. They feature a tetrahedral AFM tip that protrudes from the very end of the AFM cantilever.

This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the AFM probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the AFM tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).

Due to their very small half cone angles the AFM tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The AFM probe offers unique features:

• REAL TIP VISIBILITY FROM TOP
• metallic conductivity of the AFM tip
• high mechanical Q-factor for high sensitivity
• aspect ratio of the last 1.5 µm of the AFM tip > 4:1 (from front and side)
• AFM tip shape is defined by real crystal planes resulting in highly reproducible geometries and extremely smooth surfaces
• highly doped single crystal silicon (0.01-0.025 Ohm*cm)
• rectangular AFM cantilever with trapezoidal cross section
• holder dimensions are 1.6 mm x 3.4 mm

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode or where it is necessary to conduct high currents.