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Quantity
ARROW-NCPt-10 Box of 10 AFM Probes
415.00 EUR
ARROW-NCPt-20 Box of 20 AFM Probes
747.00 EUR
Your volume discount is 83.00 EUR or 10.00%
ARROW-NCPt-50 Box of 50 AFM Probes
1655.00 EUR
Your volume discount is 420.00 EUR or 20.20%
ARROW-NCPt-W Box of 380 AFM Probes
8786.00 EUR
Your volume discount is 6984.00 EUR or 44.30%
Product availability: On stock

ARROW-NCPt

Electrical, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Arrow
AFM Cantilever
F 285 kHz
C 42 N/m
L 160 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon
Optimized positioning through maximized tip visibility

NanoWorld Arrow™ NCPt AFM probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.

Additionally, this AFM tip offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the AFM tip on the area of interest.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 42 N/m (27 - 80 N/m)*
  • 285 kHz (240 - 380 kHz)*
  • 160 µm (155 - 165 µm)*
  • 45 µm (40 - 50 µm)*
  • 4.6 µm ( 4.1 - 5.1 µm)*
  • * typical range
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