1 Single AFM Cantilever per AFM Probe

ElectriTap300-G

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

300 kHz

C

40 N/m

L

125 µm

ElectriTap190-G

Electrical, Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

ElectriTap150-G

Electrical, Soft Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

150 kHz

C

5 N/m

L

125 µm

PPP-CONTPt

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

PPP-CONTSCPt

Electrical, Contact Mode AFM Probe with Short AFM Cantilever

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

25 kHz

C

0.2 N/m

L

225 µm

ATEC-CONTPt

Electrical, Contact Mode AFM Probe with REAL Tip Visibility

Coating: Electrically Conductive
Tip Shape: Visible

AFM Cantilever:

F

15 kHz

C

0.2 N/m

L

450 µm

ARROW-CONTPt

Electrical, Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: Electrically Conductive
Tip Shape: Arrow

AFM Cantilever:

F

14 kHz

C

0.2 N/m

L

450 µm

CONTPt

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

ElectriCont-G

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

SCM-PIC

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

SCM-PIT

Electrical, Force Modulation AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

ATEC-FMAu

Gold Coated Force Modulation AFM Probe with REAL Tip Visibility

Coating: Gold Overall
Tip Shape: Visible

AFM Cantilever:

F

85 kHz

C

2.8 N/m

L

240 µm

HQ:CSC17/Pt

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.18 N/m

L

450 µm

PPP-FMAu

Gold Coated Force Modulation AFM Probe

Coating: Gold Overall
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

USC-F1.5-k0.6

Ultra-Short Cantilever (USC) mainly dedicated to High-Speed AFM applications in liquid

Coating: Reflective Gold
Tip Shape: Cone Shaped,EBD

AFM Cantilever:

F

1500 kHz

C

0.6 N/m

L

7 µm

HQ:NSC18/Cr-Au

Gold Coated Force Modulation AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

HQ:NSC19/Cr-Au

Gold Coated Force Modulation AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

65 kHz

C

0.5 N/m

L

125 µm

240AC-GG

Gold Coated Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Coating: Gold Overall
Tip Shape: Optimized Positioning

AFM Cantilever:

F

70 kHz

C

2 N/m

L

240 µm

Multi75GB-G

Gold Coated Force Modulation AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

M-CIS

EBD AFM whisker for non-contact AFM microlens contact image sensor (CIS) inspection

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

320 kHz

C

40 N/m

L

120 µm