AFM Probes »

SCM-PIT

Order Code / Price*

Quantity

SCM-PIT-10 Box of 10 AFM Probes

423 423.00 EUR

Volume Discount Available [?]

SCM-PIT-20 Box of 20 AFM Probes

759 759.00 EUR

Your volume discount is 87.00 EUR or 10.30%

SCM-PIT-50 Box of 50 AFM Probes

1673 1673.00 EUR

Your volume discount is 442.00 EUR or 20.90%

SCM-PIT-W Box of 380 AFM Probes

8902 8902.00 EUR

Your volume discount is 7172.00 EUR or 44.60%

Product availability: On stock

SEM image of PointProbe® Plus AFM tip

SCM-PIT

Name: SCM-PIT-10 Electrical, Force Modulation AFM Probe
Brand: NanoWorld
SKU: SCM-PIT-10
Price: 423 EUR
Availability: InStock

Electrical, Force Modulation AFM Probe

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Standard

AFM Cantilever

F 75 kHz

C 2.8 N/m

L 225 µm

*nominal values

Applications

Conductive AFM Probes

How to optimize AFM scan parameters

NanoWorld Pointprobe® EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of AFM probe yields a very high force sensitivity, while simultaneously enabling tapping™ and lift mode operation.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

This AFM probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original AFM probe which has always been manufactured by NanoWorld®.

This AFM probe features alignment grooves on the back side of the holder chip.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 2.8 N/m (1.2 - 5.5 N/m)*

Resonance Frequency: 75 kHz (60 - 90 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 28 µm (22.5 - 32.5 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

* typical range