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HQ:NSC35/Al BS

Order Code / Price*

Quantity

HQ:NSC35/Al BS-15 Box of 15 AFM Probes

385 385.00 USD

Volume Discount Available [?]

HQ:NSC35/Al BS-50 Box of 50 AFM Probes

1100 1100.00 USD

Your volume discount is 183.33 USD or 14.30%

HQ:NSC35/Al BS-100 Box of 100 AFM Probes

1900 1900.00 USD

Your volume discount is 666.67 USD or 26.00%

HQ:NSC35/Al BS-200 Box of 200 AFM Probes

3500 3500.00 USD

Your volume discount is 1633.33 USD or 31.80%

HQ:NSC35/Al BS-400 Box of 400 AFM Probes

5800 5800.00 USD

Your volume discount is 4466.67 USD or 43.50%

Product availability: On stock

AFM probe with 3 different soft tapping mode AFM cantilevers by MikroMasch

AFM tip of MikroMasch AFM probe with 3 different soft tapping mode AFM cantilevers

SEM image of MikroMasch general purpose AFM probe tip close-up

Schematic of three-lever NSC series MikroMasch AFM Probe

HQ:NSC35/Al BS

Name: HQ:NSC35/Al BS-15 AFM Probe with 3 Different Tapping Mode AFM Cantilevers
Brand: MikroMasch
SKU: HQ:NSC35/Al BS-15
Price: 385 USD
Availability: InStock

AFM Probe with 3 Different Tapping Mode AFM Cantilevers

Manufacturer: MikroMasch

Coating: Reflective Aluminum
AFM tip shape: Rotated

This probe features 3 cantilevers

F 205 kHz

C 8.9 N/m

L 110 µm

F 300 kHz

C 16 N/m

L 90 µm

F 150 kHz

C 5.4 N/m

L 130 µm

*nominal values

Applications

How to optimize AFM scan parameters

AFM probes of the 35 series have three different tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.

Back side Al coated. Coating thickness - 30 nm.

AFM Tip:

Shape: Rotated

Height: 15 µm (12 - 18 µm)*

Full Cone Angle: 40°

Radius: < 8 nm

3 AFM Cantilevers:

Cantilever A

Shape: Beam

Force Constant: 8.9 N/m (2.7 - 24 N/m)*

Resonance Frequency: 205 kHz (130 - 290 kHz)*

Length: 110 µm (105 - 115 µm)*

Width: 35 µm (32 - 38 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

Cantilever B

Shape: Beam

Force Constant: 16 N/m (4.8 - 44 N/m)*

Resonance Frequency: 300 kHz (185 - 430 kHz)*

Length: 90 µm (85 - 95 µm)*

Width: 35 µm (32 - 38 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

Cantilever C

Shape: Beam

Force Constant: 5.4 N/m (1.7 - 14 N/m)*

Resonance Frequency: 150 kHz (95 - 205 kHz)*

Length: 130 µm (125 - 135 µm)*

Width: 35 µm (32 - 38 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

* typical range

Steps in LaAlO3 film

Non-Contact mode topography image of LaAlO3 thin film on SrTiO3 single crystal. One step corresponds to 1 unit cell of SrTiO3 with a height of 0.3905nm.

Scanned with a MikroMasch HQ:NSC35/Al BS AFM probe, short cantilever on an NT-MDT Ntegra Prima system; 3x1.3 micron scan size

Image courtesy of Dr. Martin Lilienblum, Department of Materials, ETH Zurich, Switzerland

Steps in LaAlO3 film

AFM non-contact mode topography image of LaAlO3 thin film on SrTiO3 single crystal. One step corresponds to 1 unit cell of SrTiO3 with a height of 0.3905nm.

Scanned with a MikroMasch HQ:NSC35/Al BS AFM probe, short cantilever on an NT-MDT Ntegra Prima system; 3x1.3 micron scan size

Image courtesy of Dr. Martin Lilienblum, PhD Student at the Department of Materials, ETH Zurich, Switzerland