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HQ:NSC18/Cr-Au-15 Box of 15 AFM Probes
420.00 USD
HQ:NSC18/Cr-Au-50 Box of 50 AFM Probes
1200.00 USD
Your volume discount is 200.00 USD or 14.30%
HQ:NSC18/Cr-Au-100 Box of 100 AFM Probes
2050.00 USD
Your volume discount is 750.00 USD or 26.80%
Product availability: On stock
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HQ:NSC18/Cr-Au

Gold Coated Force Modulation AFM Probe

Manufacturer: MikroMasch

Coating: Gold Overall
AFM tip shape: Rotated
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon

AFM cantilevers of the 18 series are optimal for Lift mode operation AFM since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM cantilevers are also used for mapping of materials properties in Force modulation mode and true topography imaging of the soft samples in Soft tapping mode.

AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.

This AFM probe features alignment grooves on the back side of the holder chip.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tip side and back side of the AFM cantilever.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 27.5 µm (24.5 - 30.5 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • * typical range
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