AFM cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tapping AFM tip. AFM probes with coatings can also be used in conductive AFM techniques.
AFM probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm.
This AFM probe features alignment grooves on the back side of the holder chip.
