AFM cantilevers of the 17 series with low force constant offer high sensitivity in contact mode AFM. These AFM cantilevers are also used for Lateral Force Microscopy.
AFM probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm.
This AFM probe features alignment grooves on the back side of the holder chip.
