AFM cantilevers of the 19 series combine the high frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*. These AFM cantilevers are also used for Lateral force microscopy LFM due to their high sensitivity to the lateral forces.
High-resolution AFM probe with a hydrophobic diamond-like extratip at the apex of the silicon etched AFM probe.
