SSS-SEIH

For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The AFM probe offers unique features:

• excellent AFM tip radius of curvature
• typical aspect ratio at 200 nm from AFM tip apex in the order of 3:1
• monolithic material
• highly doped silicon to dissipate static charge
• chemically inert
• high mechanical Q-factor for high sensitivity
• precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.