SSS-QMFMR

The NANOSENSORS™ SSS-QMFMR AFM probe combines the high resolution performance of the SuperSharpSilicon™ magnetic force microscopy probe with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. An extremely small radius of the coated AFM tip, a high aspect ratio at the last few hundred nanometers of the AFM tip and a Q-factor of more than 35,000 facilitates outstanding lateral resolution in the magnetic force image and high operation stability under UHV conditions.

Due to the low magnetic moment of the AFM tip the sensitivity to magnetic forces is decreased if compared to standard MFM AFM probe but the disturbance of soft magnetic samples is also reduced.

The SPM probe offers unique features:

• hard magnetic coating on the AFM tip side (coercivity of app. 125 Oe, remanence magnetization of app. 80 emu/cm3)
• effective magnetic moment 0.25x of standard MFM AFM probes
• metallic electrical conductivity
• excellent AFM tip radius of curvature
• magnetic resolution better than 25 nm
• Al coating on detector side of AFM cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5
• excellent mechanical Q-factor under UHV conditions for high sensitivity
• precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

As both coatings are almost stress-free the bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length. For enhanced signal strength the magnetization of the AFM tip by means of a strong permanent magnet prior to the measurement is recommended.

This AFM probe features alignment grooves on the back side of the holder chip.