PPP-ZEILR

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS™ PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.

The AFM probe offers unique features:

• excellent AFM tip radius of curvature
• highly doped silicon to dissipate static charge
• Al coating on detector side of AFM cantilever
• high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.