PPP-NCLPt

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS^™ PPP-NCL AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). As an alternative to NANOSENSORS^™ high frequency non contact type (NCH) the NCL type is offered. This type is recommended if the feedback loop of the microscope does not accept high frequencies (400kHz) or if the detection system needs a minimum AFM cantilever length >125µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.

The AFM probe offers unique features:

• metallic conductivity of the AFM tip
• high mechanical Q-factor for high sensitivity
• precise alignment of the AFM cantilever position (within +/-2µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.