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Quantity
PPP-CONTPt-10 Box of 10 AFM Probes
534.00 USD
PPP-CONTPt-50 Box of 50 AFM Probes
2104.00 USD
Your volume discount is 566.00 USD or 21.20%
PPP-CONTPt-W Box of 380 AFM Probes
11048.00 USD
Your volume discount is 9244.00 USD or 45.60%
Product availability: On stock

PPP-CONTPt

Electrical, Contact Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Electrically Conductive
AFM tip shape: Standard
AFM Cantilever
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values
Applications
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The PointProbe®Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTPt AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The PPP-CONTPt type is optimized for high sensitivity due to a low force constant.

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 0.2 N/m (0.02 - 0.77 N/m)*
  • 13 kHz (6 - 21 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (42.5 - 57.5 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * guaranteed range
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