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PPP-CONTAuD

Order Code / Price*

Quantity

PPP-CONTAuD-10 Box of 10 AFM Probes

381 381.00 USD

Product availability: On stock

Front view SEM image of PointProbe® Plus AFM tip

Close-up view SEM image of PointProbe® Plus AFM tip

PPP-CONTAuD

Name: PPP-CONTAuD-10 Gold Coated Contact Mode AFM Probe
Brand: NANOSENSORS
SKU: PPP-CONTAuD-10
Price: 381 USD
Availability: InStock

Gold Coated Contact Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflective Gold
AFM tip shape: Standard

AFM Cantilever

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

How to optimize AFM scan parameters

The PointProbe^® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS^™PPP-CONTAuD AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The AFM probe offers unique features:

excellent AFM tip radius of curvature
highly doped silicon to dissipate static charge
Au coating on detector side of AFM cantilever
chemically inert

This AFM probe features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 7 nm (< 10 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.02 - 0.77 N/m)*

Resonance Frequency: 13 kHz (6 - 21 kHz)*

Length: 450 µm (440 - 460 µm)*

Width: 50 µm (42.5 - 57.5 µm)*

Thickness: 2 µm ( 1 - 3 µm)*

* guaranteed range