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NW-DT-FMR

Order Code / Price*

Quantity

NW-DT-FMR-10 Box of 10 AFM Probes

1220 1220.00 USD

Volume Discount Available [?]

NW-DT-FMR-20 Box of 20 AFM Probes

2183 2183.00 USD

Your volume discount is 257.00 USD or 10.50%

NW-DT-FMR-50 Box of 50 AFM Probes

4817 4817.00 USD

Your volume discount is 1283.00 USD or 21.00%

Product availability: On stock

SEM image of diamond coated AFM tip

NW-DT-FMR

Name: NW-DT-FMR-10 Diamond Coated Force Modulation AFM Probe
Brand: NanoWorld
SKU: NW-DT-FMR-10
Price: 1220 USD
Availability: InStock

Diamond Coated Force Modulation AFM Probe

Manufacturer: NanoWorld

Coating: Diamond
AFM tip shape: Standard

AFM Cantilever

F 105 kHz

C 6.2 N/m

L 225 µm

*nominal values

Applications

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

NanoWorld Pointprobe® FM AFM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact AFM probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe.

All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For applications that require hard contact between AFM tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.

The typical macroscopic AFM tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

This AFM probe features alignment grooves on the back side of the holder chip.

Diamond Coating / Aluminum Reflex Coating

The diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the AFM cantilever resulting in an unsurpassed hardness of the AFM tip.

The aluminum reflex coating deposited on the detector side of the AFM cantilever enhances the reflectance of the laser beam and prevents light from interfering within the AFM cantilever.

AFM Tip:

Shape: Standard

AFM Cantilever:

Shape: Beam

Force Constant: 6.2 N/m (3 - 11.4 N/m)*

Resonance Frequency: 105 kHz (80 - 130 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 27.5 µm (22.5 - 32.5 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

* typical range