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Order Code / Price*
Quantity
Tap190E-G-10 Box of 10 AFM Probes
240.00 USD
Tap190E-G-50 Box of 50 AFM Probes
1050.00 USD
Your volume discount is 150.00 USD or 12.50%
Product availability: On stock

ElectriTap190-G

Electrical, Tapping Mode AFM Probe with Long AFM Cantilever

Manufacturer: BudgetSensors

Coating: Electrically Conductive
AFM tip shape: Rotated
AFM Cantilever
F 190 kHz
C 48 N/m
L 225 µm
*nominal values
Applications
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Micromachined monolithic silicon AFM probe for non-contact and tapping mode operation, and electric modes such as:

  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KPFM)
  • scanning capacitance microscopy (SCM)
  • piezoresponse force microscopy (PFM)

BudgetSensors' Tap190-G series features a 225 µm long AFM cantilever and it is designed as an alternative to BudgetSensors' Tap300 in cases when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum AFM cantilever length > 125 µm.

The consistent AFM tip radius of less than 25 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

The AFM probe features an overall chromium-platinum coating.

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.

Consistent high quality at a lower price!

This AFM probe features alignment grooves on the back side of the holder chip.

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 48 N/m (28 - 75 N/m)*
  • 190 kHz (160 - 220 kHz)*
  • 225 µm (215 - 235 µm)*
  • 38 µm (33 - 43 µm)*
  • 7 µm ( 6 - 8 µm)*
  • * typical range
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