CP-CONT-SiO

This colloidal probe combines the well-known features of the proven NANOSENSORS™ TL-CONT tipless AFM probes, such as high application versatility and compatibility with most commercial SPMs, with a spherical microparticle instead of a sharp AFM tip.

The Colloidal Probe Technique, in which single colloids are attached with polymer glue to AFM cantilevers for force measurements, offers possibilities for a better understanding of fundamental interactions in a variety of fields. Examples are adhesion phenomena, particle-surface interactions, mechanical properties, suspensions, hydrodynamics and boundary slip, to name just a few out of the increasing number of applications.

• sphere material: silicon dioxide (SiO₂)
• excellent sphere diameter: A = 2 µm, B = 3.5 µm, C = 6.62 µm, D = 10.2 µm, or E = 15 µm (all +/- 5%)
  Please choose A, B, C, D, or E when ordering!
• highly doped silicon AFM cantilever to dissipate static charge, chemically inert to most common solvents
• high mechanical Q-factor for high sensitivity
• precise alignment of the AFM cantilever position when used together with the NANOSENSORS™ Alignment Chip

Due to the different microparticle masses the resonance frequency may be lower than the one specified for the base tipless AFM cantilever.

This AFM probe features alignment grooves on the back side of the holder chip.