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ARROW-EFM

Order Code / Price*

Quantity

ARROW-EFM-10 Box of 10 AFM Probes

452 452.00 USD

Volume Discount Available [?]

ARROW-EFM-20 Box of 20 AFM Probes

806 806.00 USD

Your volume discount is 98.00 USD or 10.80%

ARROW-EFM-50 Box of 50 AFM Probes

1783 1783.00 USD

Your volume discount is 477.00 USD or 21.10%

ARROW-EFM-W Box of 380 AFM Probes

9488 9488.00 USD

Your volume discount is 7688.00 USD or 44.80%

Product availability: On stock

Top view SEM image of ARROW™ AFM cantilever

SEM images of ARROW™ AFM tip

ARROW-EFM

Name: ARROW-EFM-10 Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Brand: NanoWorld
SKU: ARROW-EFM-10
Price: 452 USD
Availability: InStock

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Arrow

AFM Cantilever

F 75 kHz

C 2.8 N/m

L 240 µm

*nominal values

Applications

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

Silicon based beam deflection AFM cantilever for electrostatic force mode. Rectangular AFM cantilever that is shaped like an arrow. PtIr5 coating on both sides. PtIr-coating on both sides. Wide detector side for easy adjustment of the detection system, small width at the AFM tip side reduces damping.

All AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.

Additionally, this AFM tip offers an excellent tip radius of curvature.

The unique Arrow™ shape of the cantilever allows easy positioning of the AFM tip on the area of interest.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Arrow

Radius: < 25 nm

AFM Cantilever:

Shape:

Force Constant: 2.8 N/m (1.4 - 5.8 N/m)*

Resonance Frequency: 75 kHz (58 - 97 kHz)*

Length: 240 µm (235 - 245 µm)*

Width: 35 µm (30 - 40 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

* typical range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.