By simply buying larger package sizes of Advanced Surface Microscopy, Inc. AFM probes, you automatically get a built-in quantity discount compared to the smallest packaging size.
300-1D
Calibration Specimen, 1-dimensional, 288nm Nominal Period, W-coated Photoresist on Si
Product Description
300-1D Calibration Specimen, 1-dimensional, 288 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si Substrate: Silicon about 4x3 mm. Default mounting: on 12 or 15 mm diam. steel disk
Available as unmounted SEM calibration specimen (301CE)
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