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Quantity
OSCM-PT-10 Box of 10 AFM Probes
390.00 USD
OSCM-PT-50 Box of 50 AFM Probes
1550.00 USD
Your volume discount is 400.00 USD or 20.50%
OSCM-PT-100 Box of 100 AFM Probes
2800.00 USD
Your volume discount is 1100.00 USD or 28.20%
Product availability: On stock
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OSCM-PT

Electrical, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Electrically Conductive
AFM tip shape: Optimized Positioning
AFM Cantilever
F 70 kHz
C 2 N/m
L 240 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon
The OSCM-PT is designed for AC mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc. The overall platinum coating ensures high electrical conductivity and significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

This AFM probe features alignment grooves on the back side of the holder chip.

25 nm Pt on both sides of the cantilever
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm ( 2.1 - 3.1 µm)*
  • * typical range
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