NanoAndMore Logo
Choose a different region
  • NanoAndMore Europe
  • NanoAndMore Japan
  • NanoAndMore SE Asia
Log in
Register
0 Shopping Cart
View Shopping Cart
[ Your cart is empty. ] 0.00
Please note:

NanoAndMore USA does not ship to your country

You can switch to our colleagues from NanoAndMore Europe, NanoAndMore South East Asia and NanoAndMore Japan from the top of the page.

globe logo xs
  • Log in
    Register
  • 0 Shopping Cart
    View Shopping Cart
    [ Your cart is empty. ] 0.00
  • AFM Probes Catalog
  • AFM Info
  • AFM Accessories
  • Other Products
  • News
  • Contact
AFM Probes  »  
3.4 mm x 1.6 mm AFM Support Chips
Reset
AFM Probe Filter
cat-icon
cat-icon
cat-icon
Related Categories
  • Standard Non-Rotated AFM Tips
  • Rotated AFM Tips
  • AFM Tips with Maximized AFM Tip Visibility
  • AFM Tips Protruding from the Very End of the AFM Cantilever
  • AFM Tips at the Very End of the AFM Cantilever
  • AFM Tips with Square-Based Pyramid
  • AFM Tips with Rectangular-Based Pyramid
  • Circular Symmetric AFM Tips
  • Spike AFM Tips
  • 4-sided Sharpened Casted Pyramidal AFM Tips
  • 3-sided Sharpened Pyramidal AFM Tips
  • 3-sided Super Sharpened Pyramidal AFM Tips
  • Focused Ion Beam AFM Tips
  • Tilt Compensated Focused Ion Beam AFM Tips
  • Electron Beam Deposited AFM Tips

3.4 mm x 1.6 mm AFM Support Chips

AFM probes with 3.4 mm x 1.6 mm support chips
Sort by:
Q-AR5 NanoWorld
Q-AR5

Premounted High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
CS-20NG BudgetSensors
CS-20NG
XYZ Calibration Nanogrid; Arrays with Down to 500nm Pitch; 20nm Height
HR-MFM-225C0_7-ML1-R Team Nanotec
HR-MFM-225C0_7-ML1-R
Hard magnetic AFM probe
Coating: Magnetic
Tip Shape: Cone Shaped
AFM Cantilever:
F
45 kHz
C
0.7 N/m
L
225 µm
NANOSENSORS™ Special Developments List (SDL) NANOSENSORS
NANOSENSORS™ Special Developments List (SDL)
Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
Coating: various
Tip Shape: various
21
  • <<
  • <
  • 17
  • 18
  • 19
  • 20
  • 21
No more results
Loading
nanosensors-logo
nanoworld-logo
budgetsensors-logo
mikromasch-logo
opus-logo
sqube-logo
nanotools-logo
AFM Probes
  • Non-Contact / Standard Tapping Mode AFM Probes
  • Non-Contact / Soft Tapping Mode AFM Probes
  • Fluid Tapping AFM Probes
  • Hardened/ Enhanced Wear Resistance Tapping AFM Probes
  • High Quality Factor AFM Cantilevers
  • Force Modulation (FM) AFM Probes
  • Contact Mode AFM Probes
  • Life Science AFM Probes
  • Ultra High Frequency AFM Probes
  • Conductive AFM Probes
  • Magnetic AFM Probes
  • Supersharp AFM Probes
  • Diamond AFM Probes
  • Hardened / Enhanced Wear Resistance AFM Probes
  • Nanoindentation and Lithography AFM Probes
  • High Aspect Ratio (HAR) AFM Probes
  • PeakForce Tapping® AFM Probes
  • PeakForce Kelvin Probe Force Microscopy AFM Probes
  • PeakForce TUNA™ AFM Probes
  • PeakForce Quantitative Nanomechanics AFM Probes
  • PeakForce QNM High-Accuracy AFM Probes
  • ScanAsyst®** AFM Probes
  • Silicon Nitride AFM Probes
  • Lateral Force Microscopy (LFM) AFM Probes
  • Tipless AFM Cantilevers and Cantilever Arrays
  • Self-Sensing & Self-Actuating AFM Probes
  • Sphere AFM Tips and Colloidal AFM Probes by sQube
  • Platinum Silicide AFM Probes
  • OMCL-AC160TS Replacement AFM Probes
  • OMCL-AC240TS Replacement AFM Probes
  • OMCL-AC200TS Replacement AFM Probes
  • OMCL-AC55TS Replacement AFM Probes
  • OMCL-AC240TM Replacement AFM Probes
  • OMCL-TR800PSA Replacement AFM Probes
  • Original and unaltered OLYMPUS AFM probes
  • Premounted AFM Probes
AFM Probes Info
  • AFM Tips
  • AFM Cantilevers
  • AFM Support Chips
  • Special AFM Probes
  • How to Optimize AFM Scan Parameters
  • AFM Probe Videos
  • AFM Image Gallery
More Products
  • AFM Accessories
  • Other Products
Online Shop
  • Monthly promotion
  • Disclaimer
  • How to buy
  • Profile/Registration
  • Terms and conditions
  • Shipping Methods
  • Return/Refund Policy
  • Privacy
Information
  • News
  • Links
  • Contact
  • Impressum
** ScanAsyst® and PeakForce Tapping™ are trademarks of Bruker Corporation
*** OLYMPUS® is a trademark of Olympus Corporation