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PPP-NCHPt

Order Code / Price*

Quantity

PPP-NCHPt-10 Box of 10 AFM Probes

534 534.00 USD

Volume Discount Available [?]

PPP-NCHPt-20 Box of 20 AFM Probes

954 954.00 USD

Your volume discount is 114.00 USD or 10.70%

PPP-NCHPt-50 Box of 50 AFM Probes

2104 2104.00 USD

Your volume discount is 566.00 USD or 21.20%

PPP-NCHPt-W Box of 380 AFM Probes

11048 11048.00 USD

Your volume discount is 9244.00 USD or 45.60%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

Side view SEM image of PointProbe® Plus AFM tip

Front view SEM image of PointProbe® Plus AFM tip

PPP-NCHPt

Name: PPP-NCHPt-10 Electrical, Tapping Mode AFM Probe
Brand: NANOSENSORS
SKU: PPP-NCHPt-10
Price: 534 USD
Availability: InStock

Electrical, Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Electrically Conductive
AFM tip shape: Standard

AFM Cantilever

F 330 kHz

C 42 N/m

L 125 µm

*nominal values

Applications

Conductive AFM Probes

How to optimize AFM scan parameters

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS^™ PPP-NCHPt AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.

The AFM probe offers unique features:

metallic conductivity of the AFM tip
high mechanical Q-factor for high sensitivity

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This AFM probe features alignment grooves on the back side of the holder chip.

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 42 N/m (10 - 130 N/m)*

Resonance Frequency: 330 kHz (204 - 497 kHz)*

Length: 125 µm (115 - 135 µm)*

Width: 30 µm (22.5 - 37.5 µm)*

Thickness: 4 µm ( 3 - 5 µm)*

* guaranteed range