PeakForce Quantitative Nanomechanics AFM Probes

PeakForce Tapping® based quantitative nanomechanical measurements (QNM) of modulus, adhesion force, deformation, energy dissipation, etc.

In addition to the AFM probes listed below, you can also consider the NANOSENSORS™ Special Developments List AFM probes SD-R30-NCH (R=30nm) and SD-T7L100 (C=600N/m).

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3XC-NN
3XC-NN
AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM  Tips at the Very End of the AFM Cantilevers
Coating: none
Tip Shape: Optimized Positioning
AFM Cantilevers: 3
1
2
3
F
17 kHz
150 kHz
75 kHz
C
0.3 N/m
9 N/m
2.5 N/m
L
500 µm
175 µm
240 µm
HQ:XSC11/No Al
HQ:XSC11/No Al
AFM Probe with 4 Different Cantilevers for Various Applications
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15 kHz
80 kHz
155 kHz
350 kHz
C
0.2 N/m
2.7 N/m
7 N/m
42 N/m
L
500 µm
210 µm
150 µm
100 µm
4XC-NN
4XC-NN
AFM Probe with 4 Different AFM Cantilevers with AFM Tips at the Very End of the AFM Cantilevers
Coating: none
Tip Shape: Optimized Positioning
AFM Cantilevers: 4
1
2
3
4
F
17 kHz
75 kHz
150 kHz
1200 kHz
C
0.3 N/m
2.5 N/m
9 N/m
100 N/m
L
500 µm
240 µm
175 µm
65 µm
best bang for your buck
SiNi
SiNi
Silicon Nitride AFM Probe with 2 Different AFM Cantilevers on Each Side of the Chip
Coating: Reflective Gold
Tip Shape: Pyramid
AFM Cantilevers: 4
1
2
F
30 kHz
10 kHz
C
0.27 N/m
0.06 N/m
L
100 µm
200 µm
CDT-NCHR
CDT-NCHR
Diamond Coated, Conductive Tapping Mode AFM Probe
Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F
400 kHz
C
80 N/m
L
125 µm
NW-CDT-NCHR
NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F
400 kHz
C
80 N/m
L
125 µm
top value
HQ:DMD-XSC11
HQ:DMD-XSC11
AFM Probe with 4 Different Diamond Coated, Conductive Cantilevers for Various Applications
Coating: Conductive Diamond
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
18 kHz
110 kHz
210 kHz
450 kHz
C
0.5 N/m
6.5 N/m
18 N/m
95 N/m
L
500 µm
210 µm
150 µm
100 µm
SEIHR
SEIHR
Special Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: Standard
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
NW-SSS-SEIH
NW-SSS-SEIH
SuperSharp, Special Tapping Mode AFM Probe
Coating: none
Tip Shape: Supersharp
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
NANOSENSORS™ Special Developments List (SDL)
NANOSENSORS™ Special Developments List (SDL)
Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
Coating: various
Tip Shape: various
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