AFM Probes »

4XC-NN

Order Code / Price*

Quantity

4XC-NN-10 Box of 10 AFM Probes

410 410.00 USD

Volume Discount Available [?]

4XC-NN-24 Box of 24 AFM Probes

840 840.00 USD

Your volume discount is 144.00 USD or 14.60%

4XC-NN-50 Box of 50 AFM Probes

1650 1650.00 USD

Your volume discount is 400.00 USD or 19.50%

4XC-NN-100 Box of 100 AFM Probes

3000 3000.00 USD

Your volume discount is 1100.00 USD or 26.80%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

SEM image of OPUS 4XC AFM probe with 4 silicon AFM cantilevers and AFM tips

SEM image of OPUS 4XC AFM probe, side with long AFM cantilevers

SEM image of OPUS 4XC AFM probe, side with short AFM cantilevers

Side view SEM image of Opus uncoated AFM tip

Side View SEM image of Opus uncoated AFM tip

4XC-NN

Name: 4XC-NN-10 AFM Probe with 4 Different AFM Cantilevers with AFM Tips at the Very End of the AFM Cantilevers
Brand: OPUS by MikroMasch
SKU: 4XC-NN-10
Price: 410 USD
Availability: InStock

AFM Probe with 4 Different AFM Cantilevers with AFM Tips at the Very End of the AFM Cantilevers

Manufacturer: OPUS by MikroMasch

Coating: none
AFM tip shape: Optimized Positioning

This probe features 4 cantilevers

F 17 kHz

C 0.3 N/m

L 500 µm

F 75 kHz

C 2.5 N/m

L 240 µm

F 150 kHz

C 9 N/m

L 175 µm

F 1200 kHz

C 100 N/m

L 65 µm

*nominal values

Applications

How to optimize AFM scan parameters

The 4XC series of AFM probes features four different AFM cantilevers for various measurement modes, two on each side of the holder chip:

500DC - Contact mode AFM cantilever
200AC - Standard tapping mode AFM cantilever
240AC - Soft tapping mode AFM cantilever
65AC - High resonance frequency AFM cantilever for High Speed Scanning (HSS) AFM

The uncoated AFM probes offer sharp AFM tip apexes, chemical inertness and high AFM cantilever quality factors.

The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.

Uncoated

AFM Tip:

Shape: Optimized Positioning

Height: 14 µm (12 - 16 µm)*

Setback: 0 µm

Radius: < 7 nm

Half Cone Angle: 0° front, 35° back, <9° side

4 AFM Cantilevers:

Contact mode cantilever

Shape: Beam

Force Constant: 0.3 N/m (0.1 - 0.6 N/m)*

Resonance Frequency: 17 kHz (11 - 22 kHz)*

Length: 500 µm (485 - 515 µm)*

Width: 30 µm (28 - 32 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

Soft AC mode cantilever

Shape: Beam

Force Constant: 2.5 N/m (0.75 - 5.3 N/m)*

Resonance Frequency: 75 kHz (50 - 100 kHz)*

Length: 240 µm (225 - 255 µm)*

Width: 30 µm (28 - 32 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

Standard AC mode cantilever

Shape: Beam

Force Constant: 9 N/m (2.8 - 21 N/m)*

Resonance Frequency: 150 kHz (100 - 200 kHz)*

Length: 175 µm (160 - 190 µm)*

Width: 40 µm (38 - 42 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

High frequency AC mode cantilever

Shape: Beam

Force Constant: 100 N/m (35 - 215 N/m)*

Resonance Frequency: 1200 kHz (650 - 1850 kHz)*

Length: 65 µm (50 - 80 µm)*

Width: 31 µm (29 - 33 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

* typical range