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Special micromachined silicon nitride AFM probe for soft contact imaging. This AFM probe features
The holder chip with dimensions 3.4 x 1.6 x 0.45 mm fits most commercial AFM systems Consistent high quality at a lower price!
Consistent high quality at a lower price!
This is a topography image of a holographic, UV optimized, blazed diffraction grating with 2400 lines/mm. It is a good graphic illustration of how much further at the nanoscale Atomic Force Microscopy allows us to ‘see’ beyond what any optical device could. The ridges diffract visible and near-UV light. To light these ridges are perfectly flat. The AFM using a sharp BudgetSensors tip shows us that their surface is actually quite rough.
Scanned with a BudgetSensors SiNi AFM probe, long cantilever in contact mode, 3 micron scan size
Image courtesy of Dr. Yordan Stefanov, Innovative Solutions Bulgaria
Topography scan of bacteria and negative imprints thereof in dried potato agar
Scanned with a BudgetSensors SiNi AFM probe, long cantilever, 10 micron scan size
Image courtesy of Dr. Yordan Stefanov, Innovative Solutions Bulgaria